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A new EXAFS method for the local structure analysis of low-Z elements.
- Source :
-
Journal of synchrotron radiation [J Synchrotron Radiat] 2016 Jan; Vol. 23 (1), pp. 281-5. Date of Electronic Publication: 2016 Jan 01. - Publication Year :
- 2016
-
Abstract
- A unique analytical method is proposed for local structure analysis via extended X-ray absorption fine structure (EXAFS) spectroscopy. The measurement of electron energy distribution curves at various excitation photon energies using an electron energy analyzer is applied to determine a specific elemental Auger spectrum. To demonstrate the method, the N K-edge EXAFS spectra for a silicon nitride film were obtained via simultaneous measurement of the N KLL Auger and background spectra using dual-energy windows. The background spectrum was then used to remove the photoelectrons and secondary electron mixing in the energy distribution curves. The spectrum obtained following this subtraction procedure represents the `true' N K-edge EXAFS spectrum without the other absorptions that are observed in total electron yield N K-edge EXAFS spectra. The first nearest-neighbor distance (N-Si) derived from the extracted N K-edge EXAFS oscillation was in good agreement with the value derived from Si K-edge analysis. This result confirmed that the present method, referred to as differential electron yield (DEY)-EXAFS, is valid for deriving local surface structure information for low-Z elements.
Details
- Language :
- English
- ISSN :
- 1600-5775
- Volume :
- 23
- Issue :
- 1
- Database :
- MEDLINE
- Journal :
- Journal of synchrotron radiation
- Publication Type :
- Academic Journal
- Accession number :
- 26698075
- Full Text :
- https://doi.org/10.1107/S1600577515021165