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Atomically precise semiconductor--graphene and hBN interfaces by Ge intercalation.

Authors :
Verbitskiy NI
Fedorov AV
Profeta G
Stroppa A
Petaccia L
Senkovskiy B
Nefedov A
Wöll C
Usachov DY
Vyalikh DV
Yashina LV
Eliseev AA
Pichler T
Grüneis A
Source :
Scientific reports [Sci Rep] 2015 Dec 07; Vol. 5, pp. 17700. Date of Electronic Publication: 2015 Dec 07.
Publication Year :
2015

Abstract

The full exploration of the potential, which graphene offers to nanoelectronics requires its integration into semiconductor technology. So far the real-world applications are limited by the ability to concomitantly achieve large single-crystalline domains on dielectrics and semiconductors and to tailor the interfaces between them. Here we show a new direct bottom-up method for the fabrication of high-quality atomically precise interfaces between 2D materials, like graphene and hexagonal boron nitride (hBN), and classical semiconductor via Ge intercalation. Using angle-resolved photoemission spectroscopy and complementary DFT modelling we observed for the first time that epitaxially grown graphene with the Ge monolayer underneath demonstrates Dirac Fermions unaffected by the substrate as well as an unperturbed electronic band structure of hBN. This approach provides the intrinsic relativistic 2D electron gas towards integration in semiconductor technology. Hence, these new interfaces are a promising path for the integration of graphene and hBN into state-of-the-art semiconductor technology.

Details

Language :
English
ISSN :
2045-2322
Volume :
5
Database :
MEDLINE
Journal :
Scientific reports
Publication Type :
Academic Journal
Accession number :
26639608
Full Text :
https://doi.org/10.1038/srep17700