Single grain boundary break junction for suspended nanogap electrodes with gapwidth down to 1-2 nm by focused ion beam milling.

Authors :: Cui A
Liu Z
Dong H
Wang Y
Zhen Y
Li W
Li J
Gu C
Hu W
Source :: Advanced materials (Deerfield Beach, Fla.) [Adv Mater] 2015 May 20; Vol. 27 (19), pp. 3002-6. Date of Electronic Publication: 2015 Apr 08.
Publication Year :: 2015
Abstract: Single grain boundary junctions are used for the fabrication of suspended nanogap electrodes with a gapwidth down to 1-2 nm through the break of such junctions by focused ion beam (FIB) milling. With advantages of stability and no debris, such nanogap electrodes are suitable for single molecular electronic device construction.<br /> (© 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.)

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