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Absolute flatness measurement using oblique incidence setup and an iterative algorithm. A demonstration on synthetic data.

Authors :
Vannoni M
Source :
Optics express [Opt Express] 2014 Feb 10; Vol. 22 (3), pp. 3538-46.
Publication Year :
2014

Abstract

A method to provide absolute planarity measurements through an interferometric oblique incidence setup and an iterative algorithm is presented. With only three measurements, the calibration of absolute planarity is achieved in a fast and effective manner. Demonstration with synthetic data is provided, and the possible application to very long flat mirrors is pointed out.

Details

Language :
English
ISSN :
1094-4087
Volume :
22
Issue :
3
Database :
MEDLINE
Journal :
Optics express
Publication Type :
Academic Journal
Accession number :
24663643
Full Text :
https://doi.org/10.1364/OE.22.003538