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A novel low energy electron microscope for DNA sequencing and surface analysis.
- Source :
-
Ultramicroscopy [Ultramicroscopy] 2014 Oct; Vol. 145, pp. 36-49. Date of Electronic Publication: 2014 Jan 31. - Publication Year :
- 2014
-
Abstract
- Monochromatic, aberration-corrected, dual-beam low energy electron microscopy (MAD-LEEM) is a novel technique that is directed towards imaging nanostructures and surfaces with sub-nanometer resolution. The technique combines a monochromator, a mirror aberration corrector, an energy filter, and dual beam illumination in a single instrument. The monochromator reduces the energy spread of the illuminating electron beam, which significantly improves spectroscopic and spatial resolution. Simulation results predict that the novel aberration corrector design will eliminate the second rank chromatic and third and fifth order spherical aberrations, thereby improving the resolution into the sub-nanometer regime at landing energies as low as one hundred electron-Volts. The energy filter produces a beam that can extract detailed information about the chemical composition and local electronic states of non-periodic objects such as nanoparticles, interfaces, defects, and macromolecules. The dual flood illumination eliminates charging effects that are generated when a conventional LEEM is used to image insulating specimens. A potential application for MAD-LEEM is in DNA sequencing, which requires high resolution to distinguish the individual bases and high speed to reduce the cost. The MAD-LEEM approach images the DNA with low electron impact energies, which provides nucleobase contrast mechanisms without organometallic labels. Furthermore, the micron-size field of view when combined with imaging on the fly provides long read lengths, thereby reducing the demand on assembling the sequence. Experimental results from bulk specimens with immobilized single-base oligonucleotides demonstrate that base specific contrast is available with reflected, photo-emitted, and Auger electrons. Image contrast simulations of model rectangular features mimicking the individual nucleotides in a DNA strand have been developed to translate measurements of contrast on bulk DNA to the detectability of individual DNA bases in a sequence.<br /> (Copyright © 2014 Elsevier B.V. All rights reserved.)
- Subjects :
- Computer Simulation
DNA, B-Form chemistry
DNA, B-Form ultrastructure
Electrons
Equipment Design
High-Throughput Nucleotide Sequencing instrumentation
High-Throughput Nucleotide Sequencing methods
High-Throughput Nucleotide Sequencing statistics & numerical data
Microscopy, Electron methods
Microscopy, Electron statistics & numerical data
Nanostructures
Optical Devices
Optical Phenomena
Photoelectron Spectroscopy
Sequence Analysis, DNA methods
Sequence Analysis, DNA statistics & numerical data
Surface Properties
Microscopy, Electron instrumentation
Sequence Analysis, DNA instrumentation
Subjects
Details
- Language :
- English
- ISSN :
- 1879-2723
- Volume :
- 145
- Database :
- MEDLINE
- Journal :
- Ultramicroscopy
- Publication Type :
- Academic Journal
- Accession number :
- 24524867
- Full Text :
- https://doi.org/10.1016/j.ultramic.2014.01.007