Metal/nanowire contacts, quantum confinement, and their roles in the generation of new, gigantic actions in nanowire transistors.

A distinctly new route for the design, modeling and electrical behavior of very short-channel (5-10 nm in channel length) nanowire field-effect transistors (FETs) has been presented. Essential elements of the approach entail a drain current determined by thermionic emission, but not by carrier mobility in the channel of the transistor. A basic understanding of the fundamental physics and the concepts of Schottky-barrier-based design for the proposed route have been described. Quantum confinement in the nanowire channel together with Schottky barrier tailing and temperature-dependent fluctuations of applied biases has been taken into account for the development of the model. Both current-voltage characteristics and transconductance of FETs have been studied. The calculated results are in near-quantitative agreement with the available experiments. Measured data show very diverse (e.g., exponential, linear, saturating, and non-linear non-exponential non-saturating) nanowire transistor characteristics. The model explains these characteristics well and reveals a number of new transistor actions. It highlights the impacts of quantum confinement and Schottky contacts for these new transistor actions. It also quantifies the significant enhancement of the drain-source current and transconductance. With new findings thus achieved, suggestions for the realization of very high-performance, small-diameter (preferably 2 nm), small-Schottky-barrier-height, high-operating temperature, ultra-short-channel-length, nanowire transistors have been made. Optimized design of these transistors has been suggested. And the range (in terms of device and technological parameters) of the proposed model has been elucidated.