Use of atomic force microscopy (AFM) to explore cell wall properties and response to stress in the yeast Saccharomyces cerevisiae.

MLA

Francois, Jean Marie, et al. “Use of Atomic Force Microscopy (AFM) to Explore Cell Wall Properties and Response to Stress in the Yeast Saccharomyces Cerevisiae.” Current Genetics, vol. 59, no. 4, Nov. 2013, pp. 187–96. EBSCOhost, https://doi.org/10.1007/s00294-013-0411-0.

APA

Francois, J. M., Formosa, C., Schiavone, M., Pillet, F., Martin-Yken, H., & Dague, E. (2013). Use of atomic force microscopy (AFM) to explore cell wall properties and response to stress in the yeast Saccharomyces cerevisiae. Current Genetics, 59(4), 187–196. https://doi.org/10.1007/s00294-013-0411-0

Chicago

Francois, Jean Marie, Cécile Formosa, Marion Schiavone, Flavien Pillet, Hélène Martin-Yken, and Etienne Dague. 2013. “Use of Atomic Force Microscopy (AFM) to Explore Cell Wall Properties and Response to Stress in the Yeast Saccharomyces Cerevisiae.” Current Genetics 59 (4): 187–96. doi:10.1007/s00294-013-0411-0.