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High-resolution electrical and chemical characterization of nm-scale organic and inorganic devices.

Authors :
Eyben P
Source :
Beilstein journal of nanotechnology [Beilstein J Nanotechnol] 2013 May 16; Vol. 4, pp. 318-9. Date of Electronic Publication: 2013 May 16 (Print Publication: 2013).
Publication Year :
2013

Details

Language :
English
ISSN :
2190-4286
Volume :
4
Database :
MEDLINE
Journal :
Beilstein journal of nanotechnology
Publication Type :
Academic Journal
Accession number :
23766955
Full Text :
https://doi.org/10.3762/bjnano.4.35