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Improving the signal-to-noise ratio of high-speed contact mode atomic force microscopy.
- Source :
-
The Review of scientific instruments [Rev Sci Instrum] 2012 Aug; Vol. 83 (8), pp. 083710. - Publication Year :
- 2012
-
Abstract
- During high-speed contact mode atomic force microscopy, higher eigenmode flexural oscillations of the cantilever have been identified as the main source of noise in the resultant topography images. We show that by selectively filtering out the frequencies corresponding to these oscillations in the time domain prior to transforming the data into the spatial domain, significant improvements in image quality can be achieved.
Details
- Language :
- English
- ISSN :
- 1089-7623
- Volume :
- 83
- Issue :
- 8
- Database :
- MEDLINE
- Journal :
- The Review of scientific instruments
- Publication Type :
- Academic Journal
- Accession number :
- 22938306
- Full Text :
- https://doi.org/10.1063/1.4747455