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Test-re-test reliability of the Hopkins Verbal Learning Test-Revised in individuals with traumatic brain injury.

Authors :
O'Neil-Pirozzi TM
Goldstein R
Strangman GE
Glenn MB
Source :
Brain injury [Brain Inj] 2012; Vol. 26 (12), pp. 1425-30. Date of Electronic Publication: 2012 Jun 20.
Publication Year :
2012

Abstract

Primary Objective: To determine test-re-test reliability of the Hopkins Verbal Learning Test-Revised (HVLT-R) in a group of individuals with traumatic brain injury (TBI).<br />Research Design: Single-group repeated measures design.<br />Methods and Procedures: Seventy-five individuals with TBI were administered the HVLT-R twice, with 6-8 weeks between the two test sessions.<br />Main Outcomes and Results: Test-re-test reliability on HVLT-R scoring parameters ranged from 0.537-0.818, with seven of the eight scoring parameters exhibiting r > 0.6. At re-test, scores did not significantly change on any of the eight HVLT-R scoring parameters.<br />Conclusions: HVLT-R use with individuals with TBI is supported. Test-re-test reliability of total recall and delayed recall sub-scores was particularly high.

Details

Language :
English
ISSN :
1362-301X
Volume :
26
Issue :
12
Database :
MEDLINE
Journal :
Brain injury
Publication Type :
Academic Journal
Accession number :
22715921
Full Text :
https://doi.org/10.3109/02699052.2012.694561