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Real-time index profile measurement during GRIN glass fabrication.
- Source :
-
Applied optics [Appl Opt] 1988 Feb 01; Vol. 27 (3), pp. 508-15. - Publication Year :
- 1988
-
Abstract
- A new instrument for measuring the evolution of index profiles during diffusion in hot (500 degrees C) glass is presented. This instrument, called the oven interferometer, has a spatial resolution of 10 microm at 0.6471 microm and a phase resolution of lambda/50. The development of index profiles with both time-dependent and constant boundary conditions is shown.
Details
- Language :
- English
- ISSN :
- 1559-128X
- Volume :
- 27
- Issue :
- 3
- Database :
- MEDLINE
- Journal :
- Applied optics
- Publication Type :
- Academic Journal
- Accession number :
- 20523632
- Full Text :
- https://doi.org/10.1364/AO.27.000508