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Real-time index profile measurement during GRIN glass fabrication.

Authors :
Houde-Walter S
Moore DT
Source :
Applied optics [Appl Opt] 1988 Feb 01; Vol. 27 (3), pp. 508-15.
Publication Year :
1988

Abstract

A new instrument for measuring the evolution of index profiles during diffusion in hot (500 degrees C) glass is presented. This instrument, called the oven interferometer, has a spatial resolution of 10 microm at 0.6471 microm and a phase resolution of lambda/50. The development of index profiles with both time-dependent and constant boundary conditions is shown.

Details

Language :
English
ISSN :
1559-128X
Volume :
27
Issue :
3
Database :
MEDLINE
Journal :
Applied optics
Publication Type :
Academic Journal
Accession number :
20523632
Full Text :
https://doi.org/10.1364/AO.27.000508