Effector-triggered and pathogen-associated molecular pattern-triggered immunity differentially contribute to basal resistance to Pseudomonas syringae.

MLA

Zhang, Jie, et al. “Effector-Triggered and Pathogen-Associated Molecular Pattern-Triggered Immunity Differentially Contribute to Basal Resistance to Pseudomonas Syringae.” Molecular Plant-Microbe Interactions : MPMI, vol. 23, no. 7, July 2010, pp. 940–48. EBSCOhost, https://doi.org/10.1094/MPMI-23-7-0940.

APA

Zhang, J., Lu, H., Li, X., Li, Y., Cui, H., Wen, C.-K., Tang, X., Su, Z., & Zhou, J.-M. (2010). Effector-triggered and pathogen-associated molecular pattern-triggered immunity differentially contribute to basal resistance to Pseudomonas syringae. Molecular Plant-Microbe Interactions : MPMI, 23(7), 940–948. https://doi.org/10.1094/MPMI-23-7-0940

Chicago

Zhang, Jie, Haibin Lu, Xinyan Li, Yan Li, Haitao Cui, Chi-Kuang Wen, Xiaoyan Tang, Zhen Su, and Jian-Min Zhou. 2010. “Effector-Triggered and Pathogen-Associated Molecular Pattern-Triggered Immunity Differentially Contribute to Basal Resistance to Pseudomonas Syringae.” Molecular Plant-Microbe Interactions : MPMI 23 (7): 940–48. doi:10.1094/MPMI-23-7-0940.