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Measurement of the chromatic variation of index of refraction gradients.

Authors :
Moore DT
Ryan DP
Source :
Applied optics [Appl Opt] 1982 Mar 15; Vol. 21 (6), pp. 1042-51.
Publication Year :
1982

Abstract

The theory of multiple-wavelength ac interferometry has been developed. A system has been constructed and used to measure simultaneously the index of refraction profile and the chromatic variation of the index of refraction gradient. Samples of gradient-index glass manufactured by Bausch & Lomb (Rochester, N.Y.), University of Rochester (Rochester, N.Y.), and Schott Optical (Mainz, West Germany) have been characterized.

Details

Language :
English
ISSN :
1559-128X
Volume :
21
Issue :
6
Database :
MEDLINE
Journal :
Applied optics
Publication Type :
Academic Journal
Accession number :
20389801
Full Text :
https://doi.org/10.1364/AO.21.001042