The self-adjusting file (SAF). Part 3: removal of debris and smear layer-A scanning electron microscope study.

MLA

Metzger, Zvi, et al. “The Self-Adjusting File (SAF). Part 3: Removal of Debris and Smear Layer-A Scanning Electron Microscope Study.” Journal of Endodontics, vol. 36, no. 4, Apr. 2010, pp. 697–702. EBSCOhost, https://doi.org/10.1016/j.joen.2009.12.037.

APA

Metzger, Z., Teperovich, E., Cohen, R., Zary, R., Paqué, F., & Hülsmann, M. (2010). The self-adjusting file (SAF). Part 3: removal of debris and smear layer-A scanning electron microscope study. Journal of Endodontics, 36(4), 697–702. https://doi.org/10.1016/j.joen.2009.12.037

Chicago

Metzger, Zvi, Ehud Teperovich, Raphaela Cohen, Raviv Zary, Frank Paqué, and Michael Hülsmann. 2010. “The Self-Adjusting File (SAF). Part 3: Removal of Debris and Smear Layer-A Scanning Electron Microscope Study.” Journal of Endodontics 36 (4): 697–702. doi:10.1016/j.joen.2009.12.037.