Electrostatic force microscopy study on the domain switching properties of the Pb(Zr0.2Ti0.8)O3 thin films with different crystallographic orientations for the probe-based data storage.

MLA

Cho, Seong-Moon, et al. “Electrostatic Force Microscopy Study on the Domain Switching Properties of the Pb(Zr0.2Ti0.8)O3 Thin Films with Different Crystallographic Orientations for the Probe-Based Data Storage.” Ultramicroscopy, vol. 108, no. 10, Sept. 2008, pp. 1081–85. EBSCOhost, https://doi.org/10.1016/j.ultramic.2008.04.021.

APA

Cho, S.-M., Nam, H.-J., Park, B. H., & Jeon, D.-Y. (2008). Electrostatic force microscopy study on the domain switching properties of the Pb(Zr0.2Ti0.8)O3 thin films with different crystallographic orientations for the probe-based data storage. Ultramicroscopy, 108(10), 1081–1085. https://doi.org/10.1016/j.ultramic.2008.04.021

Chicago

Cho, Seong-Moon, Hyo-Jin Nam, Bae Ho Park, and Duk-Young Jeon. 2008. “Electrostatic Force Microscopy Study on the Domain Switching Properties of the Pb(Zr0.2Ti0.8)O3 Thin Films with Different Crystallographic Orientations for the Probe-Based Data Storage.” Ultramicroscopy 108 (10): 1081–85. doi:10.1016/j.ultramic.2008.04.021.