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Theoretical development of a high-resolution differential-interference-contrast optic for x-ray microscopy.
- Source :
-
Optics express [Opt Express] 2008 Jan 21; Vol. 16 (2), pp. 1132-41. - Publication Year :
- 2008
-
Abstract
- In this paper, the theoretical background and development of a differential-interference contrast (DIC) x-ray optic is presented. The single-element optic is capable of high-resolution phase contrast imaging and is compatible with compact sources. It is shown that an understanding of the coherence requirements in this type of imaging is imperative and is explained in detail. The optic is capable of a wavefront separation equal to the resolution of the optic which places only minor constraints on the object illumination.
- Subjects :
- Equipment Design
Equipment Failure Analysis
Microscopy, Interference methods
Radiographic Image Enhancement methods
Reproducibility of Results
Sensitivity and Specificity
X-Ray Diffraction methods
Microscopy, Interference instrumentation
Radiographic Image Enhancement instrumentation
X-Ray Diffraction instrumentation
Subjects
Details
- Language :
- English
- ISSN :
- 1094-4087
- Volume :
- 16
- Issue :
- 2
- Database :
- MEDLINE
- Journal :
- Optics express
- Publication Type :
- Academic Journal
- Accession number :
- 18542187
- Full Text :
- https://doi.org/10.1364/oe.16.001132