Back to Search
Start Over
High resolution 3D x-ray diffraction microscopy.
- Source :
-
Physical review letters [Phys Rev Lett] 2002 Aug 19; Vol. 89 (8), pp. 088303. Date of Electronic Publication: 2002 Aug 06. - Publication Year :
- 2002
-
Abstract
- We have imaged a 2D buried Ni nanostructure at 8 nm resolution using coherent x-ray diffraction and the oversampling phasing method. By employing a 3D imaging reconstruction algorithm, for the first time we have experimentally determined the 3D structure of a noncrystalline nanostructured material at 50 nm resolution. The 2D and 3D imaging resolution is currently limited by the exposure time and the computing power, while the ultimate resolution is limited by the x-ray wavelengths. We believe these results pave the way for the development of atomic resolution 3D x-ray diffraction microscopy.
- Subjects :
- Microscopy methods
X-Ray Diffraction methods
Subjects
Details
- Language :
- English
- ISSN :
- 0031-9007
- Volume :
- 89
- Issue :
- 8
- Database :
- MEDLINE
- Journal :
- Physical review letters
- Publication Type :
- Academic Journal
- Accession number :
- 12190506
- Full Text :
- https://doi.org/10.1103/PhysRevLett.89.088303