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High resolution 3D x-ray diffraction microscopy.

Authors :
Miao J
Ishikawa T
Johnson B
Anderson EH
Lai B
Hodgson KO
Source :
Physical review letters [Phys Rev Lett] 2002 Aug 19; Vol. 89 (8), pp. 088303. Date of Electronic Publication: 2002 Aug 06.
Publication Year :
2002

Abstract

We have imaged a 2D buried Ni nanostructure at 8 nm resolution using coherent x-ray diffraction and the oversampling phasing method. By employing a 3D imaging reconstruction algorithm, for the first time we have experimentally determined the 3D structure of a noncrystalline nanostructured material at 50 nm resolution. The 2D and 3D imaging resolution is currently limited by the exposure time and the computing power, while the ultimate resolution is limited by the x-ray wavelengths. We believe these results pave the way for the development of atomic resolution 3D x-ray diffraction microscopy.

Details

Language :
English
ISSN :
0031-9007
Volume :
89
Issue :
8
Database :
MEDLINE
Journal :
Physical review letters
Publication Type :
Academic Journal
Accession number :
12190506
Full Text :
https://doi.org/10.1103/PhysRevLett.89.088303