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Material anisotropy revealed by phase contrast in intermittent contact atomic force microscopy.
- Source :
-
Physical review letters [Phys Rev Lett] 2002 Jun 03; Vol. 88 (22), pp. 226103. Date of Electronic Publication: 2002 May 17. - Publication Year :
- 2002
-
Abstract
- Phase contrast in intermittent-contact atomic force microscopy (AFM) reveals in-plane structural and mechanical properties of polymer monolayers. This is surprising, because measurements of nanoscale in-plane properties typically require contact mode microscopies. Our measurements are possible because the tip oscillates not just perpendicular but also parallel to the sample surface along the long axis of the cantilever. This lateral tip displacement is virtually universal in AFM, implying that any oscillating-tip AFM technique is sensitive to in-plane material properties.
Details
- Language :
- English
- ISSN :
- 0031-9007
- Volume :
- 88
- Issue :
- 22
- Database :
- MEDLINE
- Journal :
- Physical review letters
- Publication Type :
- Academic Journal
- Accession number :
- 12059433
- Full Text :
- https://doi.org/10.1103/PhysRevLett.88.226103