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Phonon dispersion curves in wurtzite-structure GaN determined by inelastic x-ray scattering.

Authors :
Ruf T
Serrano J
Cardona M
Pavone P
Pabst M
Krisch M
D'Astuto M
Suski T
Grzegory I
Leszczynski M
Source :
Physical review letters [Phys Rev Lett] 2001 Jan 29; Vol. 86 (5), pp. 906-9.
Publication Year :
2001

Abstract

We have investigated the lattice dynamics of a wurtzite GaN single crystal by inelastic x-ray scattering. Several dispersion branches and phonons at high-symmetry points have been measured, including the two zone-center Raman- and infrared-inactive silent modes. The experiments have been complemented by ab initio calculations. They are in very good agreement with our measurements, not only for phonon energies, but also for scattering intensities, thus validating the correctness of the eigenvectors. Other phenomenological and ab initio theories exhibit significant differences.

Details

Language :
English
ISSN :
0031-9007
Volume :
86
Issue :
5
Database :
MEDLINE
Journal :
Physical review letters
Publication Type :
Academic Journal
Accession number :
11177970
Full Text :
https://doi.org/10.1103/PhysRevLett.86.906