Digital radiography with a large-area, amorphous-silicon, flat-panel X-ray detector system.

Rationale and Objectives: To investigate the image quality of a digital radiography system with an amorphous-silicon, large-area, digital flat-panel detector.
Methods: A flat-panel detector based on a matrix of amorphous silicon was integrated into a projection radiography system. The scintillator consisted of a layer of structured cesium iodide. The active matrix size of 30002 pixels together with a pixel size of 143 microm provided a large image area of 43 x 43 cm2. Basic image quality parameters such as detective quantum efficiency (DQE) and modulation transfer function (MTF) were measured and compared with those obtained with conventional systems.
Results: The measurement of DQE yielded a high value of 70% at zero spatial frequency. At a system dose equivalent to 400 speed, the DQE of the digital system was a factor of two larger than the DQE of a storage phosphor or screen-film system within the entire spatial frequency range between zero and the Nyquist limit of 3.5 line pairs per millimeter. The flat-panel detector furthermore has an MTF that is superior to that in regular screen-film systems and also provides a substantially larger dynamic range.
Conclusions: This new technology demonstrates its potential to provide equal or superior image quality to conventional screen-film systems and to reduce patient exposure to radiation dose. The advantages of digital radiography systems, based on a flat-panel detector as an instant image display, facilitation of work flow in the radiology department, and digital networking and archiving, are well in sight.