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Feature Papers in Electronic Materials Section.
-
Abstract
- Summary: This book entitled "Feature Papers in Electronic Materials Section" is a collection of selected papers recently published on the journal Materials, focusing on the latest advances in electronic materials and devices in different fields (e.g., power- and high-frequency electronics, optoelectronic devices, detectors, etc.). In the first part of the book, many articles are dedicated to wide band gap semiconductors (e.g., SiC, GaN, Ga2O3, diamond), focusing on the current relevant materials and devices technology issues. The second part of the book is a miscellaneous of other electronics materials for various applications, including two-dimensional materials for optoelectronic and high-frequency devices. Finally, some recent advances in materials and flexible sensors for bioelectronics and medical applications are presented at the end of the book.
- Subjects :
- Energy industries & utilities
History of engineering & technology
Technology: general issues
2D materials
3C-SiC
4H-SiC
CVD
CVD graphene
Fabry-Perot filter
Ga2O3
GaAs
GaN
GaN-on-diamond
HEMT
InGaAs channel
KOH etching
MOS
MPCVD growth
MoS2
SIMS
Schottky barrier
Schottky diodes
Ti3SiC2
ZnGa2O4
aluminum oxide
arrhythmia detection
binary oxides
bulk growth
cardiovascular monitoring
charge removal rate
chemical vapour deposition
compensation
compliant substrates
cubic silicon carbide
defects
degradation
diamond
diodes
doping
electrical characterization
electron microscopy
energy electronics
epitaxial lift-off
flexible bioelectronics
flexible electronics
gallium oxide
gate dielectric
graphene absorption
heteroepitaxy
high-throughput method
high-κ dielectrics
hybrid integration
instability
insulators
interface
iron-based superconductor
irradiation temperature
material printing
nanomanufacturing
nanomembrane
ohmic contact
optical fibers
power electronics
proton and electron irradiation
pulsed laser deposition
quasi-vertical GaN
radiation effects
radiation hardness
radio frequency sputtering
reliability
silica point defects
silicon carbide
simulation
soft biosensors
spinel
stacking faults
stress
thermal management
thin film
threshold voltage
transistors
transmission electron microscopy
trapping
traps
trench MOS
ultra-wide bandgap
van der Waals
vertical GaN
wearable sensors
wide band gap semiconductors
Subjects
Details
- Language :
- English
- ISBN :
- 9783036532264
9783036532271
books978-3-0365-3226-4 - ISBNs :
- 9783036532264, 9783036532271, and 9783036532264
- Database :
- Jio Institute Digital Library OPAC
- Journal :
- Feature Papers in Electronic Materials Section
- Notes :
- 004131, Journalism, Open Access star Unrestricted online access, Creative Commons https://creativecommons.org/licenses/by/4.0/ cc https://creativecommons.org/licenses/by/4.0/, English
- Publication Type :
- eBook
- Accession number :
- jio.Koha.JDL.1788
- Document Type :
- Book; Electronic document