A procedure of ICP-AES analysis of silicon using microwave digestion and preconcentration.

A combined procedure has been developed for the analysis of high-purity silicon with preliminary vapor-phase digestion and preconcentration in a microwave oven using inductively coupled plasma atomic emission spectrometry ( ICP-AES). Liners for high-pressure vessels of microwave oven ensuring the simultaneous distillation of matrices from 3-4 samples without their contact with the acid solution have been designed and manufactured. The procedure ensures the determination of up to 30 elements: Ag, Al, Be, Bi, Ca, Cd, Co, Cr, Cu, Fe, Ga, Hf, In, K, Li, Mn, Mo, Na, Nb, Ni, P, Rb, Sb, Sn, Sr, Ta, V, W, Zn, and Zr with the limits of detection 10 −10 wt %. [ABSTRACT FROM AUTHOR]