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Identification of sub-grains and low angle boundaries beyond the angular resolution of EBSD maps.

Authors :
Germain, L.
Kratsch, D.
Salib, M.
Gey, N.
Source :
Materials Characterization. Dec2014, Vol. 98, p66-72. 7p.
Publication Year :
2014

Abstract

A new method called ALGrId (Anti-Leak GRain IDentification) is proposed for the detection of sub-grains beyond the relative angular resolution of Electron Backscatter Diffraction maps. It does not use any additional information such as Kikuchi Pattern Quality map nor need data filtering. It uses a modified Dijkstra algorithm which seeks the continuous set of boundaries having the highest average disorientation angle. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
10445803
Volume :
98
Database :
Academic Search Index
Journal :
Materials Characterization
Publication Type :
Academic Journal
Accession number :
99742156
Full Text :
https://doi.org/10.1016/j.matchar.2014.10.007