Direct imaging of thermally-activated grain-boundary diffusion in Cu/Co/IrMn/Pt exchange-bias structures using atom-probe tomography.

MLA

Letellier, F., et al. “Direct Imaging of Thermally-Activated Grain-Boundary Diffusion in Cu/Co/IrMn/Pt Exchange-Bias Structures Using Atom-Probe Tomography.” Journal of Applied Physics, vol. 116, no. 20, Nov. 2014, pp. 203906-1-203906–5. EBSCOhost, https://doi.org/10.1063/1.4902954.

APA

Letellier, F., Lechevallier, L., Lardé, R., Le Breton, J.-M., Akmaldinov, K., Auffret, S., Dieny, B., & Baltz, V. (2014). Direct imaging of thermally-activated grain-boundary diffusion in Cu/Co/IrMn/Pt exchange-bias structures using atom-probe tomography. Journal of Applied Physics, 116(20), 203906-1-203906–5. https://doi.org/10.1063/1.4902954

Chicago

Letellier, F., L. Lechevallier, R. Lardé, J.-M. Le Breton, K. Akmaldinov, S. Auffret, B. Dieny, and V. Baltz. 2014. “Direct Imaging of Thermally-Activated Grain-Boundary Diffusion in Cu/Co/IrMn/Pt Exchange-Bias Structures Using Atom-Probe Tomography.” Journal of Applied Physics 116 (20): 203906-1-203906–5. doi:10.1063/1.4902954.