Effects of strain and buffer layer on interfacial magnetization in Sr2CrReO6 films determined by polarized neutron reflectometry.

We have determined the depth-resolved magnetization structures of a series of highly ordered Sr2CrReO6 (SCRO) ferrimagnetic epitaxial films via combined studies of x-ray reflectometry, polarized neutron reflectometry, and superconducting quantum interference device magnetometry. The SCRofilms deposited directly on (LaAIO3)0.3(Sr2AITaO6)0.7 or SrTiO3 substrates show reduced magnetization of similar width near the interfaces with the substrates, despite having different degrees of strain. When the SCRofilm is deposited on a SrCr0.5Nb0.5O3 (SCNO) double perovskite buffer layer, the width of the interfacial region with reduced magnetization is decreased. However, the relative reduction of the magnetization averaged over the interfacial regions is comparable among the three samples. Interestingly, we found that the magnetization suppression region is wider than the Cr/Re antisite disorder region at the interface between SCRO and SCNO. [ABSTRACT FROM AUTHOR]