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Characterization Softwares For Your RF Devices.

Authors :
DELISLE, JEAN-JACQUES
Source :
Microwaves & RF. Sep2014, Vol. 53 Issue 9, p112-113. 2p. 2 Color Photographs.
Publication Year :
2014

Abstract

The article offers brief information on several software-enhanced test systems including Component Test System from Auriga, Focus Device Characterization Suite (FDCS) from Focus Microwaves and Automated Characterization Suite from Keithley Instruments Inc.

Subjects

Subjects :
*MILLIMETER wave devices
*MICROWAVE devices testing
*TESTING equipment

Details

Language :
English
ISSN :
07452993
Volume :
53
Issue :
9
Database :
Academic Search Index
Journal :
Microwaves & RF
Publication Type :
Periodical
Accession number :
98519527

Tools

Authors Abstract Subjects Details