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Interface analysis of Y-Ba-Cu-O films on Al-coated Si substrates.
- Source :
-
Applied Physics Letters . 3/27/1989, Vol. 54 Issue 13, p1275. 3p. - Publication Year :
- 1989
-
Abstract
- Y-Ba-Cu-O films were deposited on Al-coated Si substrates by the plasma-spray method. The Al buffer layer appears to be effective in yielding crack-free adhesive Y-Ba-Cu-O films. Resistance measurements indicate that the films exhibit a superconducting phase below 90 K. Results of x-ray microanalysis and x-ray photoelectron spectroscopy confirm that the Al buffer forms an Al2O3 layer and prevents precipitation of Cu at the film/substrate interface. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 54
- Issue :
- 13
- Database :
- Academic Search Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 9830517
- Full Text :
- https://doi.org/10.1063/1.101489