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Can p-channel tunnel field-effect transistors perform as good as n-channel?

Authors :
Verhulst, A. S.
Verreck, D.
Pourghaderi, M. A.
Van de Put, M.
Soree, B.
Groeseneken, G.
Collaert, N.
Thean, A. V.-Y.
Source :
Applied Physics Letters. 7/28/2014, Vol. 105 Issue 4, p1-4. 4p. 1 Diagram, 1 Chart, 4 Graphs.
Publication Year :
2014

Abstract

We show that bulk semiconductor materials do not allow perfectly complementary p- and n-channel tunnel field-effect transistors (TFETs), due to the presence of a heavy-hole band. When tunneling in p-TFETs is oriented towards the gate-dielectric, field-induced quantum confinement results in a highest-energy subband which is heavy-hole like. In direct-bandgap IIIV materials, the most promising TFET materials, phonon-assisted tunneling to this subband degrades the subthreshold swing and leads to at least 10 smaller on-current than the desired ballistic on-current. This is demonstrated with quantum-mechanical predictions for p-TFETs with tunneling orthogonal to the gate, made out of InP, In0.53Ga0.47As, InAs, and a modified version of In0.53Ga0.47As with an artificially increased conduction-band density-of-states. We further show that even if the phonon-assisted current would be negligible, the build-up of a heavy-hole-based inversion layer prevents efficient ballistic tunneling, especially at low supply voltages. For p-TFET, a strongly confined n-i-p or n-p-i-p configuration is therefore recommended, as well as a tensily strained line-tunneling configuration. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
105
Issue :
4
Database :
Academic Search Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
97347412
Full Text :
https://doi.org/10.1063/1.4891348