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Cleaving Breakthrough: A New Method Removes Old Limitations.

Authors :
Moyal, Efrat
Brandstädt, Ekkehart
Source :
Electronic Device Failure Analysis. Aug2014, Vol. 16 Issue 3, p26-31. 6p.
Publication Year :
2014

Abstract

The article presents case studies related to the indent-and cleaving method developed by LatticeGear LLC, cleaving solutions provider for semiconductor industry. Topics discussed include effectiveness of the method as compare to manual cleaving, factors related to the scribe-and-cleaving method and sample-preparation success through the indent-and-cleaving technique. Several tables are also presented related to the comparison of the methods.

Details

Language :
English
ISSN :
15370755
Volume :
16
Issue :
3
Database :
Academic Search Index
Journal :
Electronic Device Failure Analysis
Publication Type :
Academic Journal
Accession number :
96971285
Full Text :
https://doi.org/10.31399/asm.edfa.2014-3.p026