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A Configurable and Strong RAS Solution for Die-Stacked DRAM Caches.
- Source :
-
IEEE Micro . May2014, Vol. 34 Issue 3, p80-90. 11p. - Publication Year :
- 2014
-
Abstract
- The resiliency problem of die-stacked memory will become important because of its lack of serviceability. This article details how to provide practical and cost-effective reliability, availability, and serviceability support for die-stacked DRAM cache architectures. The proposed approach can provide varying levels of protection, from fine-grained single-bit upsets to coarser-grained faults within the constraints of commodity non-error-correcting code DRAM stacks. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 02721732
- Volume :
- 34
- Issue :
- 3
- Database :
- Academic Search Index
- Journal :
- IEEE Micro
- Publication Type :
- Academic Journal
- Accession number :
- 96647233
- Full Text :
- https://doi.org/10.1109/MM.2014.13