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A Configurable and Strong RAS Solution for Die-Stacked DRAM Caches.

Authors :
Sim, Jaewoong
Loh, Gabriel H.
Sridharan, Vilas
O'Connor, Mike
Source :
IEEE Micro. May2014, Vol. 34 Issue 3, p80-90. 11p.
Publication Year :
2014

Abstract

The resiliency problem of die-stacked memory will become important because of its lack of serviceability. This article details how to provide practical and cost-effective reliability, availability, and serviceability support for die-stacked DRAM cache architectures. The proposed approach can provide varying levels of protection, from fine-grained single-bit upsets to coarser-grained faults within the constraints of commodity non-error-correcting code DRAM stacks. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
02721732
Volume :
34
Issue :
3
Database :
Academic Search Index
Journal :
IEEE Micro
Publication Type :
Academic Journal
Accession number :
96647233
Full Text :
https://doi.org/10.1109/MM.2014.13