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Synchrotron Total Reflection X-ray Fluorescence at BL-16 Microfocus Beamline of Indus-2.

Authors :
Tiwari, M. K.
Singh, A. K.
Das, Gangadhar
Chowdhury, Anupam
Lodha, G. S.
Source :
AIP Conference Proceedings. 2014, Vol. 1591, p642-643. 2p. 2 Color Photographs, 1 Graph.
Publication Year :
2014

Abstract

Determination of ultra trace elements is important in many disciplines both in basic and applied sciences. Numerous applications show their importance in medical science, environmental science, materials science, food processing and semiconductor industries and in maintaining the quality control of ultra pure chemicals and reagents. We report commissioning of a synchrotron based total reflection x-ray fluorescence (TXRF) facility on the BL-16 microfocus beamline of Indus-2. This paper describes the performance of the BL-16 TXRF spectrometer and the detailed description of its capabilities through examples of measured results. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
0094243X
Volume :
1591
Database :
Academic Search Index
Journal :
AIP Conference Proceedings
Publication Type :
Conference
Accession number :
95776141
Full Text :
https://doi.org/10.1063/1.4872703