Back to Search Start Over

Electron emission in double-electron capture with simultaneous single ionization in 30-keV/u 4He2+-Ar collisions.

Authors :
Zhang, R. T.
Ma, X.
Zhang, S. F.
Zhu, X. L.
Feng, W. T.
Guo, D. L.
Gao, Y.
Li, B.
Qian, D. B.
Liu, H. P.
Yan, S.
Zhang, P.
Source :
Physical Review A: Atomic, Molecular & Optical Physics. Mar2014, Vol. 89 Issue 3-A, p1-5. 5p.
Publication Year :
2014

Abstract

Electron emissions are studied for the double-electron capture with simultaneous single ionization process in 30 keV/u He2+-Ar atom collision using the reaction microscope technique. Double-differential cross sections have been obtained for emission angles of 0°, 20°, 45°, 90°, 128°, and 175° and electron energies ranging from 0 to 80 eV. No cusp-shaped electrons centered at a speed equal to that of the incident projectile in the forward direction are observed, which is contrary to the earlier results [D. Fregenal, J. Fiol, G. Bernardi, S. Suarez, P. Focke, A. D. Gonzalez, A. Muthig, T. Jalowy, K. O. Groeneveld, and H. Luna, Phys. Rev. A 62, 012703 (2000)]. An explanation has been provided to clarify the observed results in the current reaction channel. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
10502947
Volume :
89
Issue :
3-A
Database :
Academic Search Index
Journal :
Physical Review A: Atomic, Molecular & Optical Physics
Publication Type :
Periodical
Accession number :
95642337
Full Text :
https://doi.org/10.1103/PhysRevA.89.032708