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Towards reliable charge-mobility benchmark measurements for organic semiconductors.

Authors :
Blakesley, James C.
Castro, Fernando A.
Kylberg, William
Dibb, George F.A.
Arantes, Caroline
Valaski, Rogério
Cremona, Marco
Kim, Jong Soo
Kim, Ji-Seon
Source :
Organic Electronics. Jun2014, Vol. 15 Issue 6, p1263-1272. 10p.
Publication Year :
2014

Abstract

Highlights: [•] We study variation in mobility measurements on organic films. [•] Values extracted by different scientists typically vary by about a factor of 3. [•] We propose a protocol that drastically reduces this variation. [•] Control of film thickness and electrode quality are also important factors. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
15661199
Volume :
15
Issue :
6
Database :
Academic Search Index
Journal :
Organic Electronics
Publication Type :
Academic Journal
Accession number :
95622453
Full Text :
https://doi.org/10.1016/j.orgel.2014.02.008