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Cell-Phone Battery Drain Analysis Using LXI.
- Source :
-
EE: Evaluation Engineering . Mar2014, Vol. 53 Issue 3, p20-21. 2p. - Publication Year :
- 2014
-
Abstract
- The article offers information on instruments rolled out by Agilent Technologies, to test cell phone battery current drain and explains how it enables product designers more accuracy when predicting battery life. The test solution contains three main elements the N6705B DC power analyzer, the N6781A two quadrant source/measure unit and the 14585A control and analysis software.
Details
- Language :
- English
- ISSN :
- 01490370
- Volume :
- 53
- Issue :
- 3
- Database :
- Academic Search Index
- Journal :
- EE: Evaluation Engineering
- Publication Type :
- Periodical
- Accession number :
- 95268895