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Tetragonal-tetragonal-monoclinic-rhombohedral transition: Strain relaxation of heavily compressed BiFeO3 epitaxial thin films.

Authors :
Fu, Z.
Yin, Z. G.
Chen, N. F.
Zhang, X. W.
Zhao, Y. J.
Bai, Y. M.
Chen, Y.
Wang, H.-H.
Zhang, X. L.
Wu, J. L.
Source :
Applied Physics Letters. 2/3/2014, Vol. 104 Issue 5, p052908-1-052908-5. 5p. 1 Diagram, 5 Graphs.
Publication Year :
2014

Abstract

BiFeO3 films with in-plane compressive strain of -3.5% were deposited on oxygen-deficient La0.3Sr0.7MnO3-δ buffered SrTiO3(001) substrates. This highly strained BiFeO3 does not relax directly into its rhombohedral parent phase upon increasing the film thickness. Instead, a multi-step path involving structural transitions is observed. The misfit stress is first accommodated by the occurrence of true tetragonal BiFeO3 with c/a ratio of 1.23, then reduced by the transformation to the MC-type monoclinic structure, and finally alleviated through the MC-rhombohedral transition. Moreover, this process enables the formation of strain-driven morphotropic phase boundaries at a stress level much lower than the reported threshold of -4.5%. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
104
Issue :
5
Database :
Academic Search Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
94376825
Full Text :
https://doi.org/10.1063/1.4864077