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Study of the interface in n+μc-Si/p-type c-Si heterojunctions: role of the fluorine chemistry in the interface passivation

Authors :
Losurdo, M.
Grimaldi, A.
Sacchetti, A.
Capezzuto, P.
Ambrico, M.
Bruno, G.
Roca, Francesco
Source :
Thin Solid Films. Mar2003, Vol. 427 Issue 1/2, p171. 5p.
Publication Year :
2003

Abstract

Investigation of n–p heterojunction solar cells obtained by depositing a n-type thin silicon films either amorphous or microcrystalline on p-type c-Si is carried out. The study is focused on the improvement of the c-Si surface and emitter layer/c-Si substrate interface. The peculiarity is the use of SiF4-based plasmas for the in situ dry cleaning and passivation of the c-Si surface and for the PECVD deposition of the emitter layer that can be either amorphous (a-Si:H,F) or microcrystalline (μc-Si). The use of SiF4 instead of the conventional SiH4 results in a lower hydrogen content in the film and in a reduction of the interaction of the c-Si surface with hydrogen atoms. Furthermore, the dependence of the heterojunction solar cell photovoltaic parameters on the insertion of an intrinsic buffer layer between the n-type thin silicon layer and the p-type c-Si substrate is discussed. [Copyright &y& Elsevier]

Subjects

Subjects :
*HETEROJUNCTIONS
*SILICON

Details

Language :
English
ISSN :
00406090
Volume :
427
Issue :
1/2
Database :
Academic Search Index
Journal :
Thin Solid Films
Publication Type :
Academic Journal
Accession number :
9403088
Full Text :
https://doi.org/10.1016/S0040-6090(02)01214-2