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Study of the interface in n+μc-Si/p-type c-Si heterojunctions: role of the fluorine chemistry in the interface passivation
- Source :
-
Thin Solid Films . Mar2003, Vol. 427 Issue 1/2, p171. 5p. - Publication Year :
- 2003
-
Abstract
- Investigation of n–p heterojunction solar cells obtained by depositing a n-type thin silicon films either amorphous or microcrystalline on p-type c-Si is carried out. The study is focused on the improvement of the c-Si surface and emitter layer/c-Si substrate interface. The peculiarity is the use of SiF4-based plasmas for the in situ dry cleaning and passivation of the c-Si surface and for the PECVD deposition of the emitter layer that can be either amorphous (a-Si:H,F) or microcrystalline (μc-Si). The use of SiF4 instead of the conventional SiH4 results in a lower hydrogen content in the film and in a reduction of the interaction of the c-Si surface with hydrogen atoms. Furthermore, the dependence of the heterojunction solar cell photovoltaic parameters on the insertion of an intrinsic buffer layer between the n-type thin silicon layer and the p-type c-Si substrate is discussed. [Copyright &y& Elsevier]
- Subjects :
- *HETEROJUNCTIONS
*SILICON
Subjects
Details
- Language :
- English
- ISSN :
- 00406090
- Volume :
- 427
- Issue :
- 1/2
- Database :
- Academic Search Index
- Journal :
- Thin Solid Films
- Publication Type :
- Academic Journal
- Accession number :
- 9403088
- Full Text :
- https://doi.org/10.1016/S0040-6090(02)01214-2