Cite
Defect identification in semiconductors with positron annihilation: Experiment and theory.
MLA
Tuomisto, Filip, and Ilja Makkonen. “Defect Identification in Semiconductors with Positron Annihilation: Experiment and Theory.” Reviews of Modern Physics, vol. 85, no. 4, Oct. 2013, pp. 1583–631. EBSCOhost, https://doi.org/10.1103/RevModPhys.85.1583.
APA
Tuomisto, F., & Makkonen, I. (2013). Defect identification in semiconductors with positron annihilation: Experiment and theory. Reviews of Modern Physics, 85(4), 1583–1631. https://doi.org/10.1103/RevModPhys.85.1583
Chicago
Tuomisto, Filip, and Ilja Makkonen. 2013. “Defect Identification in Semiconductors with Positron Annihilation: Experiment and Theory.” Reviews of Modern Physics 85 (4): 1583–1631. doi:10.1103/RevModPhys.85.1583.