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A method to measure the complex permeability of thin films at ultra-high frequencies.

Authors :
Korenivski, V.
Van Dover, R.B.
Mankiewich, P.M.
Ma, Z.-X.
Becker, A.J.
Polakos, P.A.
Fratello, V.J.
Source :
IEEE Transactions on Magnetics. 1996, Vol. 32 Issue 5, p4905-4907. 3p.
Publication Year :
1996

Abstract

A swept frequency method for measuring the magnetic permeability of thin films for frequencies up to 2 GHz with a resolution at 1 GHz of /spl sim/0.1 /spl mu/m in permeance is described. It is based on the measurement of impedance of a strip loop loaded with the sample under test. The method employs a commercial impedance or network analyzer, is simple, and suitable for permeability measurements of thin magnetic films which are used in recording heads and microwave components. [ABSTRACT FROM PUBLISHER]

Details

Language :
English
ISSN :
00189464
Volume :
32
Issue :
5
Database :
Academic Search Index
Journal :
IEEE Transactions on Magnetics
Publication Type :
Academic Journal
Accession number :
93096001
Full Text :
https://doi.org/10.1109/20.539283