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Influence of excess Ba concentration on the dielectric nonlinearity in Mn and V-doped BaTiO3 multi layer ceramic capacitors.

Authors :
Yoon, Seok-Hyun
Kim, Sun-Jung
Kim, Sang-Hyuk
Kim, Doo-Young
Source :
Journal of Applied Physics. Dec2013, Vol. 114 Issue 22, p224103. 9p. 1 Color Photograph, 1 Black and White Photograph, 8 Graphs.
Publication Year :
2013

Abstract

The effect of excess Ba concentration on the dielectric nonlinearity was investigated in Mn and V-doped BaTiO3 multi layer ceramic capacitors (MLCC) under the same grain size condition, which was described by the Preisach model utilizing the first order reversal curve (FORC) distribution. The high-field dielectric constant and its ac field dependence dramatically changed increasing to a maximum and then decreasing with the increase of Ba concentration. The saturation polarization which scales to the magnitude of spontaneous polarization also showed similar behavior. These results indicate that the dependence of the dielectric constant on the Ba concentration is associated with the variation of both domain wall contribution and the magnitude of the spontaneous polarization, which could be correlated with the same dependence on the Ba concentration of the reversible FORC distribution at zero bias and the irreversible FORC distribution near origin. In the corresponding bulk specimens of the dielectrics of MLCC, almost the same amount of the Ba2TiSi2O8 second phases were detected irrespective of Ba concentration, which shows that the excess Ba incorporate into BaTiO3. Thus, low and high Ba concentration corresponds to Ba-deficient and Ba-rich or Ti-deficient BaTiO3, respectively, which results in a small spontaneous polarization and low domain wall density. The intermediate Ba concentration for the maximum dielectric constant is supposed to be near stoichiometric condition in the ABO3 structure corresponding to large spontaneous polarization and high domain wall density. The excess Ba concentration and its resultant A/B stoichiometry is a crucial factor controlling dielectric properties. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
114
Issue :
22
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
92962021
Full Text :
https://doi.org/10.1063/1.4844575