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Measurement and control of the electronic temperature in small thin-film structures.

Authors :
Leoni, R.
Buonomo, B.
Castellano, M. G.
Mattioli, F.
Simeone, D.
Torrioli, G.
Carelli, P.
Source :
Journal of Applied Physics. 3/15/2003, Vol. 93 Issue 6, p3572. 6p. 1 Diagram, 6 Graphs.
Publication Year :
2003

Abstract

We discuss the thermal properties of small metal and insulating structures, interesting for bolometer applications. We report on the characterization of thin-film thermometers based on normal metalinsulator-superconductor tunnel junctions, operating at sub-Kelvin temperature and fabricated by using either niobium or aluminum as superconducting electrodes. The effect of different bias methods on the thermometer current-voltage characteristics is measured as well as the response of small metal structures to absorbed/removed power. The characterization is performed with a helium-3 refrigerator, compatible with the instrumentation generally available in ground or space-borne experiments. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
93
Issue :
6
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
9229930
Full Text :
https://doi.org/10.1063/1.1556188