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Analysis and Optimization of a Thyristor Structure Using Backside Schottky Contacts Suited for the High Temperature.

Authors :
Toulon, Gaetan
Bourennane, Abdelhakim
Isoird, Karine
Source :
IEEE Transactions on Electron Devices. Nov2013, Vol. 60 Issue 11, p3814-3820. 7p.
Publication Year :
2013

Abstract

In high current, high voltage, high temperature (T>125^\circC) power applications, commercially available conventional silicon thyristors are not suited because they present high leakage current. In this context, this paper presents a high-symmetrical (voltage) thyristor structure that presents a lower leakage current and higher breakover voltage as compared with the conventional thyristor at T>125^\circC. It is shown through 2-D physical simulations that the replacement of the P-emitter of a standard symmetrical thyristor by a judicious association of P diffusions and Schottky contacts at the anode side contributes to the reduction of the leakage current in the forward blocking state at high temperature. A fine tune of the anode side configuration will improve the forward OFF-state behavior with only a negligible ON-state voltage drop degradation. Moreover, the comparison with the conventional anode short thyristor shows that the insertion of Schottky contacts leads to the same improvements in terms of OFF-state forward breakover voltage and leakage current and also presents a high reverse blocking voltage. [ABSTRACT FROM PUBLISHER]

Details

Language :
English
ISSN :
00189383
Volume :
60
Issue :
11
Database :
Academic Search Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
91553897
Full Text :
https://doi.org/10.1109/TED.2013.2280554