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Accurate Charge-Density Studies as an Extension of Bayesian Crystal Structure Determination.
- Source :
-
Acta Crystallographica: Section A (Wiley-Blackwell) . Nov98 Part 2, Vol. 54 Issue 6, p971. 26p. - Publication Year :
- 1998
-
Abstract
- Focuses on the first stages of extending the Bayesian program to accurate charge-density studies based on single-crystal x-ray diffraction data. Positional probability distribution of scatterers having maximum entropy relative to a given prior prejudice; Existence of non-nuclear density maxima at special positions for crystalline silicon and beryllium.
- Subjects :
- *BAYESIAN analysis
*CHARGE density waves
*CRYSTALS
*OPTICAL diffraction
Subjects
Details
- Language :
- English
- ISSN :
- 01087673
- Volume :
- 54
- Issue :
- 6
- Database :
- Academic Search Index
- Journal :
- Acta Crystallographica: Section A (Wiley-Blackwell)
- Publication Type :
- Academic Journal
- Accession number :
- 9116018
- Full Text :
- https://doi.org/10.1107/S010876739800539X