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Interface energetics at WOX/organic interfaces: The role of oxygen vacancies.

Authors :
Zhang, Zheng
Wei, Huai-Xin
Ma, Guo-Fu
Li, Yan-Qing
Lee, Shuit-Tong
Tang, Jian-Xin
Source :
Applied Physics Letters. 9/23/2013, Vol. 103 Issue 13, p133302-133302-4. 1p. 3 Graphs.
Publication Year :
2013

Abstract

Oxygen vacancy in tungsten oxide (WOX) is critical to the interface energetics for charge injection and transport in organic electronic devices. Here, we systematically studied the impact of oxygen vacancy on electronic structures of the WOX/organic hole-transport layer interface via photoemission spectroscopy. The partial reduction of W cations and a decrease in its work function were observed by controlling the degree of oxygen vacancies in WOX with thermal annealing, which are due to the partial filling of the unoccupied 5d orbitals. The increase in oxygen deficiency caused the increase of hole-injection barrier at WOX/organic interfaces. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
103
Issue :
13
Database :
Academic Search Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
90480448
Full Text :
https://doi.org/10.1063/1.4822173