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The use of a central beam stop for contrast enhancement in TEM imaging.

Authors :
Zhang, Chao
Xu, Qiang
Peters, Peter J.
Zandbergen, Henny
Source :
Ultramicroscopy. Nov2013, Vol. 134, p200-206. 7p.
Publication Year :
2013

Abstract

Abstract: Dark field TEM imaging using a stop of the central beam (DF-000) is reported. It is shown that a strong enhancement in the contrast can be obtained for graphene as example of weak phase object and endocytic multivescilar body as example of an unstained biological sample. No charging or significant contamination of the central beam stop is observed. For graphene, a resolution beyond 1Å−1 was easily obtained. DF-000 imaging can be considered as a good and easy to use alternative of a phase plate. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
03043991
Volume :
134
Database :
Academic Search Index
Journal :
Ultramicroscopy
Publication Type :
Academic Journal
Accession number :
90105896
Full Text :
https://doi.org/10.1016/j.ultramic.2013.05.019