Back to Search Start Over

Scaling of high-κ/metal-gate TriGate SOI nanowire transistors down to 10nm width.

Authors :
Coquand, R.
Barraud, S.
Cassé, M.
Leroux, P.
Vizioz, C.
Comboroure, C.
Perreau, P.
Ernst, E.
Samson, M.-P.
Maffini-Alvaro, V.
Tabone, C.
Barnola, S.
Munteanu, D.
Ghibaudo, G.
Monfray, S.
Boeuf, F.
Poiroux, T.
Source :
Solid-State Electronics. Oct2013, Vol. 88, p32-36. 5p.
Publication Year :
2013

Abstract

Highlights: [•] Fabrication of TriGate nanowires, width down to 10nm and gate length down to 20nm. [•] Demonstration of μ eff as a combination of top and sidewall conduction, for wide range of W. [•] Beneficial role of (110) sidewall conduction for PMOS TriGate (mobility enhanced versus large devices). [•] At Lg =20nm, good electrostatics (DIBL<90mV/V), for both NMOS and PMOS TriGate. [•] At Lg =20nm, good performances (I on =1mA/μm and I off =3nA/μm, top-view normalized), for both NMOS and PMOS TriGate. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
00381101
Volume :
88
Database :
Academic Search Index
Journal :
Solid-State Electronics
Publication Type :
Academic Journal
Accession number :
89615326
Full Text :
https://doi.org/10.1016/j.sse.2013.04.006