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Thickness dependence of the resistivity tensor in epitaxial magnetite thin films.
- Source :
-
Journal of Applied Physics . Jul2013, Vol. 114 Issue 4, p043701-043701-5. 1p. 1 Illustration, 5 Graphs. - Publication Year :
- 2013
-
Abstract
- We report a systematic study of the thickness dependence of the resistivity tensor of epitaxial thin films of magnetite (Fe3O4). We find that decreasing film thickness decreases the relative magnitude of the terms related to crystal symmetry but increases their field dependence. We attribute this behavior to the presence of antiphase boundaries in thin films of magnetite and the dependence of their density on the film thickness. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 114
- Issue :
- 4
- Database :
- Academic Search Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 89470944
- Full Text :
- https://doi.org/10.1063/1.4816399