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Crystallographic orientation dependence of dielectric response in lead strontium titanate thin films.
- Source :
-
Journal of Crystal Growth . Aug2013, Vol. 377, p143-146. 4p. - Publication Year :
- 2013
-
Abstract
- Abstract: This investigation presents the growth of (100), (110) and preferential (111)-oriented Pb0.6Sr0.4TiO3 thin films prepared on different orientations LaNiO3 buffered silicon substrates via radio-frequency magnetron sputtering method. The effects of the orientation on microstructure and dielectric response were systematically investigated. The capacitance–voltage property versus the crystallographic orientation analysis revealed that preferential (111)-orientation film possesses the largest relative permittivity and tunability of 1180 and 84% (at 400kV/cm) respectively, which are much higher than those of (100)- and (110)-oriented thin films. These results suggest preferential (111)-orientation films as promising candidates for microwave tunable devices. [Copyright &y& Elsevier]
Details
- Language :
- English
- ISSN :
- 00220248
- Volume :
- 377
- Database :
- Academic Search Index
- Journal :
- Journal of Crystal Growth
- Publication Type :
- Academic Journal
- Accession number :
- 89311405
- Full Text :
- https://doi.org/10.1016/j.jcrysgro.2013.05.017