Total Dose Effects: A New Approach to Assess the Impact of Radiation on Device Reliability.

MLA

Martinez, Nicolas, et al. “Total Dose Effects: A New Approach to Assess the Impact of Radiation on Device Reliability.” IEEE Transactions on Nuclear Science, vol. 60, no. 3, June 2013, pp. 2266–71. EBSCOhost, https://doi.org/10.1109/TNS.2013.2254128.

APA

Martinez, N., Gilard, O., & Quadri, G. (2013). Total Dose Effects: A New Approach to Assess the Impact of Radiation on Device Reliability. IEEE Transactions on Nuclear Science, 60(3), 2266–2271. https://doi.org/10.1109/TNS.2013.2254128

Chicago

Martinez, Nicolas, Olivier Gilard, and Gianandrea Quadri. 2013. “Total Dose Effects: A New Approach to Assess the Impact of Radiation on Device Reliability.” IEEE Transactions on Nuclear Science 60 (3): 2266–71. doi:10.1109/TNS.2013.2254128.