Total Dose Effects: A New Approach to Assess the Impact of Radiation on Device Reliability.

In this paper, a new Radiation Hardness Assurance methodology applicable to cumulative effects is proposed to assess the impact of radiation on device reliability. This approach, that relies on the stochastic interpolation of experimental data, is based on the notion of Wiener process. An example of application of this methodology is presented and a comparison with a more conventional Radiation Hardness Assurance is discussed. [ABSTRACT FROM PUBLISHER]