First call for papers: IEEE International Integrated Reliability Workshop.

The IEEE International Integrated Reliability Workshop (IIRW) focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems. Submit your two-page abstract by 12 July 2013 to be part of this unique event. For further information visit http://www.iirw.org or contact the TPC chair. [ABSTRACT FROM AUTHOR]